Seongnam, South Korea

Won-Soo Choi

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Won-Soo Choi. Retrieved from https://idiyas.com/inventor/won-soo-choi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Won-Soo Choi

Introduction

Won-Soo Choi is a notable inventor based in Seongnam, South Korea. He has made significant contributions to the field of equipment monitoring through his innovative patent. His work focuses on enhancing the reliability and efficiency of equipment by defining fault patterns.

Latest Patents

Won-Soo Choi holds a patent titled "Method of defining fault pattern of equipment and method of monitoring equipment using the same." This patent provides a method for forming reference information to define fault patterns in equipment. One embodiment of the method includes performing angle spectrum analysis by re-classifying fault points distributed on a plane. This plane consists of a first component axis and a second component axis. The method involves calculating an angle for each fault point concerning either the first or second component axis and forming a reference fault pattern based on the re-classified fault points. He has 1 patent to his name.

Career Highlights

Choi is currently employed at Samsung Electronics Co., Ltd., where he continues to develop innovative solutions in equipment monitoring. His work has contributed to advancements in the reliability of various technologies.

Collaborations

Some of his notable coworkers include Young-Hak Lee and Tae-Jin Yun, who have collaborated with him on various projects within the company.

Conclusion

Won-Soo Choi's innovative approach to defining fault patterns in equipment monitoring showcases his expertise and commitment to advancing technology. His contributions are valuable to the field and highlight the importance of innovation in improving equipment reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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