Seongnam-si, South Korea

Won-Kyu Kwak

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Won-Kyu Kwak. Retrieved from https://idiyas.com/inventor/won-kyu-kwak-y2dbzbju

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Won-Kyu Kwak and Display Panel Testing Innovation.

Introduction

Won-Kyu Kwak is an inventor associated with Seongnam-si, South Korea, and Samsung Display Co., Ltd. His patent work includes a display-panel design that supports testing through circuitry integrated into the panel.

Latest Patents

The provided information identifies one patent associated with Kwak: “Display Panel and Method of Testing the Same.” The invention describes a display with pixel columns connected to data lines, alongside a non-display area containing a test circuit. The circuit receives a lighting test signal routed through at least part of the non-display area and transfers it to the data lines in response to a test control signal. A separate switch receives a data signal from an external component and transfers it to the data lines in response to a switching signal. This arrangement provides for both lighting tests and ordinary data input.

Career Highlights

Kwak is associated with Samsung Display Co., Ltd., a company focused on display technologies. The supplied patent information credits him with 1 patent.

Collaborations

The listed coworkers are Hwan-soo Jang and Seung-Kyu Lee. Their names are provided as professional associations, though the available information does not specify their roles in the patent.

Conclusion

Won-Kyu Kwak’s documented patent work addresses display-panel testing by integrating test-signal circuitry and data switching into a panel design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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