Seoul, South Korea

Won-Jin Yi

This inventor holds 1 USPTO granted patent. Top assignee: Gmeditec Corp.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Won-Jin Yi. Retrieved from https://idiyas.com/inventor/won-jin-yi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Won-Jin Yi and 3D Image Registration

Introduction

Won-Jin Yi is an inventor based in Seoul, South Korea. His work includes a patented approach to registering three-dimensional medical images with depth-camera data and positioning information. He is associated with Gmeditec Corp.

Latest Patents

Yi is credited with 1 patent: “Device for Providing 3D Image Registration and Method Therefor.” The invention describes a system that collects depth data of a body part and an image of a registration body, along with the three-dimensional coordinates of a positioning tool. It registers a pre-stored 3D medical image with the depth data, then combines that result with landmark-position information to produce a final registration. This approach is designed to bring together multiple sources of spatial information for 3D image registration.

Career Highlights

Yi’s listed patent reflects work on medical-image registration technology. The disclosed device uses separate registration stages to align patient imaging data, camera-based landmark coordinates, and positioning-tool information.

Collaborations

Yi’s listed coworkers include Sangjeong Lee and Min-Hyuk Choi. The available information does not specify their roles in the patent or their working relationship with Yi.

Conclusion

Won-Jin Yi’s patent focuses on combining medical imaging, depth-camera data, and positioning information to support 3D image registration.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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