Yongin, South Korea

Won-Il Cho

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Won-Il Cho. Retrieved from https://idiyas.com/inventor/won-il-cho-aleiedf8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile



Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovations of Won-Il Cho

Introduction

Won-Il Cho is a notable inventor based in Yongin, South Korea. He has made significant contributions to the field of defect recognition technology. His work is particularly relevant in industries that require high precision and quality control.

Latest Patents

Won-Il Cho holds a patent titled "Reference pattern for creating a defect recognition level, method of fabricating the same and method of inspecting defects using the same." This innovative patent includes a reference pattern that comprises a blank region formed on a transparent substrate and a grating region formed adjacent to the blank region. The grating region features a plurality of parallel trench lines, which enhance the defect recognition process.

Career Highlights

Cho is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His role at Samsung allows him to work on cutting-edge technologies that impact various sectors, including electronics and manufacturing. His expertise in defect recognition has positioned him as a valuable asset to his team.

Collaborations

Some of his notable coworkers include Jin-Hyung Park and In-kyun Shin. Their collaborative efforts contribute to the advancement of technology within their field.

Conclusion

Won-Il Cho's innovative work in defect recognition technology exemplifies the importance of precision in manufacturing. His contributions continue to influence the industry and enhance quality control measures.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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