Munich, Germany

Wolfram Laux

This inventor holds 1 USPTO granted patent. Top assignee: Basler Ag. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wolfram Laux. Retrieved from https://idiyas.com/inventor/wolfram-laux

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Wolfram Laux: Innovator in Optical Detection Technology

Introduction

Wolfram Laux is a notable inventor based in Munich, Germany. He has made significant contributions to the field of optical detection technology. His innovative approach has led to the development of a unique device that enhances the precision of surface deformation detection.

Latest Patents

Wolfram Laux holds a patent for a "Device and method for optical detection of the deformation of a surface." This device utilizes a photosensitive receiver with a matrix image plane, which is illuminated by a nearly point-source light. The invention allows for high-precision detection of surface deformations, particularly useful for identifying erroneous inclinations in CDs or DVDs. The system is designed to determine deformation by comparing the actual position of the light source's image to its known nominal position on the image plane.

Career Highlights

Wolfram Laux is associated with Basler AG, a company known for its advancements in imaging technology. His work at Basler AG has been instrumental in pushing the boundaries of optical detection methods. With a focus on innovation, he continues to contribute to the field through his research and development efforts.

Collaborations

Wolfram Laux collaborates with Jurgen Klicker, enhancing the scope of their projects and driving forward their shared vision in optical technology.

Conclusion

Wolfram Laux's contributions to optical detection technology exemplify the impact of innovative thinking in solving complex problems. His patent reflects a commitment to precision and efficiency in surface deformation detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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