Barsbüttel, Germany

Wolfgang Spitzke

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Development Company, L.p.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wolfgang Spitzke. Retrieved from https://idiyas.com/inventor/wolfgang-spitzke

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Wolfgang Spitzke: Innovator in Image Processing

Introduction

Wolfgang Spitzke is a notable inventor based in Barsbuettel, Germany. He has made significant contributions to the field of image processing, particularly with his innovative approach to eye marks.

Latest Patents

Wolfgang Spitzke holds a patent for "Eye marks in image processing." This patent describes systems, methods, and devices that utilize eye marks in image processing. The method involves providing an eye mark with at least two sections arranged along a longitudinal axis. Each section includes a border common to both sections and a unique characteristic relative to other sections. Additionally, the method encodes instructions in the eye mark based on the combination of these sections. He has 1 patent to his name.

Career Highlights

Wolfgang Spitzke is currently employed at Hewlett-Packard Development Company, L.P. His work at this esteemed organization has allowed him to explore and develop innovative solutions in technology.

Collaborations

Wolfgang has collaborated with notable colleagues, including John A. Underwood and Bruce Zignego. Their combined expertise has contributed to advancements in their respective fields.

Conclusion

Wolfgang Spitzke's contributions to image processing through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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