This inventor holds 2 USPTO granted patents. Top assignee: Lasor Ag. Active years: 2001-2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001-2003
Title: Wolfgang Haubold: Inventor in Flat-Glass Inspection
Introduction
Wolfgang Haubold is an inventor associated with Bielefeld, Germany, and Lasor AG. His work focuses on methods and devices for assessing the optical quality of flat glass and detecting defects. His listed portfolio includes 2 patents.
Latest Patents
Haubold’s listed patents address the detection of faults in flat glass, including float glass, and other transparent materials.
“Method and device for detecting faults in flat glass, especially drips, threads and lines” describes a system that uses a video camera to observe an illuminating pattern through glass or in its reflection. The pattern contains adjacent sections that differ in color or intensity. The camera produces signals based on the glass’s optical quality, and changes in those signals help identify defects such as drips, threads, and lines.
“Method and device for detecting faults in flat glass” also uses a camera and an illuminating device to evaluate transparent materials. In this approach, the illumination’s color or intensity changes in a defined manner. The camera monitors the illumination, and changes in two video signals are used to assess the material and detect faults.
Career Highlights
Haubold’s listed inventions apply optical inspection techniques to quality control in flat-glass production. By combining controlled illumination with video-signal analysis, the methods are designed to reveal imperfections that may affect the appearance or quality of glass sheets.
Collaborations
The supplied information identifies Edmund Paneff and Josef Droste as Haubold’s coworkers. It does not specify their roles in the listed patents.
Conclusion
Wolfgang Haubold’s patent work centers on camera-based inspection methods that use controlled lighting and signal analysis to detect defects in flat glass and other transparent materials.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile