Ruelzheim, Germany

Wolfgang Gehrlein

This inventor holds 3 USPTO granted patents and 3 EPO patents. Top assignees: Bruker Axs Se, Other. Active years: 2018-2025.


% Patents Active = 100.0

 

Average Co-Inventor Count = 1.2

ph-index = 1


Company Filing History:


Years Active: 2018-2025

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3 patents (USPTO):Explore Patents

Title: Wolfgang Gehrlein: Innovator in X-ray Analysis Technology

Introduction

Wolfgang Gehrlein is a notable inventor based in Ruelzheim, Germany. He has made significant contributions to the field of x-ray analysis technology, holding a total of 3 patents. His innovative designs focus on enhancing the functionality and efficiency of x-ray fluorescence spectrometers.

Latest Patents

Gehrlein's latest patents include a device for closing the input opening in the sample chamber of an x-ray fluorescence spectrometer. This closure device features a slider with a closure plate and a carriage that moves laterally over the input opening. The design ensures a gas-tight seal, which is crucial for accurate measurements. Another notable patent is a device for adjusting and exchanging beamstops in an x-ray-optical system. This arrangement allows for optimization of the useful radiation ratio while minimizing interference, thus improving measurement accuracy.

Career Highlights

Throughout his career, Wolfgang Gehrlein has demonstrated a commitment to advancing x-ray analysis technology. His inventions have been instrumental in enhancing the precision and reliability of x-ray measurements. His work reflects a deep understanding of the technical challenges faced in this field.

Collaborations

Wolfgang Gehrlein collaborates with Thorsten Grau, contributing to the development of innovative solutions in x-ray technology. Their partnership has led to advancements that benefit the scientific community.

Conclusion

Wolfgang Gehrlein's contributions to x-ray analysis technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence advancements in measurement accuracy and efficiency.

Profile summary based on public USPTO records.
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