Baierbrunn, Germany

Wolfgang Burkhard

This inventor holds 1 USPTO granted patent. Top assignee: Rohde and Schwarz Gmbh & Co. Kg. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wolfgang Burkhard. Retrieved from https://idiyas.com/inventor/wolfgang-burkhard

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Innovations of Wolfgang Burkhard

Introduction

Wolfgang Burkhard is a notable inventor based in Baierbrunn, Germany. He has made significant contributions to the field of measurement technology, particularly with his innovative patent related to reflection coefficient measurement.

Latest Patents

Wolfgang Burkhard holds a patent for a "Bridge for measuring the reflection coefficient." This invention involves a reflection-coefficient bridge where the voltage drop across a neutral arm is supplied to an indicator via a coaxial cable. The design includes a balanced converter or balun, utilizing a coaxial cable and a parallel-connected line portion wound onto ferrite cores. A d.c. voltage is applied to a test object connected through a coaxial line, enhancing the measurement capabilities of the bridge.

Career Highlights

Wolfgang Burkhard is associated with Rohde and Schwarz GmbH & Co. KG, a leading company in the field of electronic test and measurement equipment. His work has contributed to advancements in measurement technology, showcasing his expertise and innovative spirit.

Collaborations

Wolfgang has collaborated with Klaus Danzeisen, further enhancing the development of measurement technologies through their combined efforts.

Conclusion

Wolfgang Burkhard's contributions to the field of measurement technology, particularly through his patent for a reflection coefficient bridge, highlight his innovative capabilities and dedication to advancing the industry. His work continues to influence measurement practices today.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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