Strasbourg, France

Wojciech Dulinski


Average Co-Inventor Count = 26.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Wojciech Dulinski: Innovator in Monolithic Active Pixel Dosimetry

Introduction

Wojciech Dulinski is a notable inventor based in Strasbourg, France. He has made significant contributions to the field of dosimetry, particularly with his innovative patent for a monolithic active pixel dosimeter. His work exemplifies the intersection of technology and practical applications in measuring radiation.

Latest Patents

Wojciech Dulinski holds a patent for a monolithic active pixel dosimeter. This device is equipped with at least one sensing cell that includes a junction sensing element. The junction sensing element features a sensing region with a first type of conductivity and a charge collecting region that has a second type of conductivity. Additionally, the sensing cell comprises an ohmic region that partially overlaps and extends laterally outside the charge collecting region, along with an annular insulating region that forms an insulating junction surrounding both the ohmic region and the charge collection region. This innovative design enhances the accuracy and efficiency of radiation measurement.

Career Highlights

Throughout his career, Wojciech Dulinski has worked with esteemed institutions such as Universitaet Karlsruhe and Akademia Gorniczo-Hutnicza. His experience in these organizations has contributed to his expertise in the field of dosimetry and semiconductor technology.

Collaborations

Wojciech has collaborated with notable professionals in his field, including Massimo Caccia and Leopoldo Conte. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Wojciech Dulinski's contributions to the field of dosimetry through his patent for a monolithic active pixel dosimeter highlight his role as an innovator. His work continues to influence advancements in radiation measurement technology.

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