Austin, TX, United States of America

Wojciech Aleksander Wilk

This inventor holds 1 USPTO granted patent. Top assignee: Amazon Technologies, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wojciech Aleksander Wilk. Retrieved from https://idiyas.com/inventor/wojciech-aleksander-wilk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Wojciech Aleksander Wilk and Automated Contribution Analysis

Introduction

Wojciech Aleksander Wilk is an inventor based in Austin, Texas, and is associated with Amazon Technologies, Inc. His patent work addresses ways to help users understand the factors behind changes in business metrics.

Latest Patents

Wilk is named on 1 patent: “Automated contribution analysis for question answering.” The disclosure describes techniques for answering natural-language “why” questions, such as why revenue declined in a particular region and quarter. It combines signals including prior use of dimension combinations, statistical properties of data columns, relationships between dimensions, and relationships between dimensions and dates. Heuristics and rules then select likely contributing factors for a metric over a specified period, helping users gain insights from their data.

Career Highlights

The patent reflects work on automated analytics and natural-language question answering. Its approach aims to make contribution analysis more accessible by identifying relevant factors and presenting them to users.

Collaborations

Wilk’s listed coworkers include Shannon Kalisky and Rishav Chakravarti. The patent is associated with Amazon Technologies, Inc.

Conclusion

Wojciech Aleksander Wilk’s patent describes an approach to explaining changes in business metrics by automatically identifying and presenting potential contributing factors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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