This inventor holds 1 USPTO granted patent. Top assignee: Deutschetelekom Ag. Active years: 2001.
Company Filing History:
Years Active: 2001
Title: Winfried Schlapp: Innovator in Nanometer Scale Manufacturing
Introduction
Winfried Schlapp is a notable inventor based in Weiterstadt, Germany. He has made significant contributions to the field of nanotechnology, particularly in the manufacturing of calibrated scales for high-resolution imaging devices. His innovative approach has implications for various technical applications, enhancing the precision of imaging techniques.
Latest Patents
Winfried Schlapp holds a patent for a "Method for manufacturing a calibrated scale in the nanometer range for technical devices used for the high resolution or ultrahigh-resolution imaging of structures." This method involves using at least two different crystalline or amorphous materials that can be easily distinguished by their contrast when imaged. The materials are deposited as a heterolayer sequence onto a substrate material, which is then characterized using an analysis method sensitive to the individual layer thicknesses. The resulting scale is particularly suited for calibrating devices used in scanning electron microscopy, scanning transmission electron microscopy, and scanning probe microscopy.
Career Highlights
Schlapp is associated with Deutsche Telekom AG, where he applies his expertise in nanotechnology. His work has been instrumental in advancing the capabilities of imaging technologies, making significant strides in the field.
Collaborations
Some of his notable coworkers include Rainer Loesch and Hartmut Hillmer, who have collaborated with him on various projects related to his innovative methods.
Conclusion
Winfried Schlapp's contributions to the field of nanotechnology and his patented methods for manufacturing calibrated scales highlight his role as a key innovator. His work continues to influence the precision of imaging technologies in technical devices.