This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Hoechst Aktiengesellschaft. Active years: 1979-1980.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1979-1980
Title: Winfried Kern: Inventor in Materials Processing and Measurement
Introduction
Winfried Kern is an inventor associated with Erftstadt, Germany. His recorded work includes 2 patents addressing carbon materials for electrothermal reduction and automated observation of interfacial phenomena.
Latest Patents
Kern’s patent, “Carbon carrier suitable for use in electrothermal reduction processes,” describes carbon carriers designed for improved reactivity in slag-forming electrothermal reduction. The carriers contain 5 to 80 weight percent of the slag formed during the reduction process, and the invention also covers a method for producing them.
His patent, “Method and arrangement for the automatic observation of interfacial phenomena,” presents an automated measurement system using an electronically compensated vacuum microbalance. The system periodically measures specimen weight, buoyancy-element weight, and specimen temperature, while determining gas pressure. A computer processes and stores the measurements, compares successive specimen-weight readings against a specified stability threshold, and directs the results to a printer. A stored program controls and monitors the repeated observations according to predetermined instructions and conditions.
Career Highlights
Kern’s listed company affiliations include Hoechst Aktiengesellschaft and Carrier Corporation. His patent work reflects interests in industrial materials and automated measurement methods.
Collaborations
Joachim Stendel and Wilhelm Valentin are identified as Kern’s coworkers.
Conclusion
Winfried Kern’s two recorded patents document contributions to reactive carbon carriers for reduction processes and computer-controlled observation of interfacial phenomena.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
