Altamonte Springs, FL, United States of America

Willis J Benckert

This inventor holds 1 USPTO granted patent. Top assignee: International Laser Systems, Inc.. Active years: 1981.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1981

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Willis J Benckert

Introduction

Willis J Benckert is a notable inventor based in Altamonte Springs, Florida. He has made significant contributions to the field of laser technology through his innovative inventions. His work primarily focuses on developing apparatuses that enhance the detection of laser radiation.

Latest Patents

One of Benckert's key patents is for an "Area Radiation Target." This target apparatus is designed for detecting laser radiation that impinges upon it. The invention features a support structure with multiple fiber optic fibers mounted on it. The ends of these fibers are connected to a radiation detector and amplifier. A radiation scattering cover is incorporated to scatter the radiation hitting the fibers, which alters the angle of light entering them. This design produces a signal on the detector, indicating when a beam of radiation strikes the target.

Career Highlights

Benckert is associated with International Laser Systems, Inc., where he continues to work on advancing laser technology. His expertise in this area has led to the development of innovative solutions that improve the efficiency and accuracy of laser detection systems.

Collaborations

Benckert collaborates with Richard J Wangler, who is also involved in the field of laser technology. Their partnership has contributed to the advancement of various projects within their company.

Conclusion

Willis J Benckert's contributions to laser technology through his patent for the Area Radiation Target exemplify his innovative spirit. His work continues to influence the field, showcasing the importance of advancements in detection systems.

Profile summary based on public USPTO records.
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