Allentown, PA, United States of America

William Zuidervliet



Average Co-Inventor Count = 5.1

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2006-2012

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2 patents (USPTO):Explore Patents

Title: **William Zuidervliet: Innovator in Measurement Technology**

Introduction

William Zuidervliet, based in Allentown, PA, is a notable inventor contributing to the field of measurement technology. With two patents to his name, his work focuses on contactless measurement of sheet charge density and mobility, which is crucial for advancing semiconductor technologies and flat panel displays.

Latest Patents

Zuidervliet's latest innovations include the "Device and handling system for measurement of mobility and sheet charge density." This apparatus utilizes a microwave source to measure important metrics of semiconductor wafers or panels at designated locations. It features a first detector for forward microwave power, a second for reflected power, and a third for Hall effect power detection. The device is equipped with an automatic positioning subsystem to facilitate seamless wafer positioning and testing, ensuring efficiency and precision in measurements.

His second patent, titled "Method and apparatus for nondestructive measurement and mapping of sheet materials," enhances the capabilities of contactless measurement. This apparatus employs similar components such as a microwave source and a circular waveguide while incorporating an eccentric bore mount for sample adjustment. By applying a magnetic field perpendicular to the sample plane, the invention enables detection of ordinary and Hall effect reflected waves, which can further streamline the process of material analysis.

Career Highlights

William Zuidervliet is currently affiliated with Lehighton Electronics, Inc., where he has not only developed significant patented technologies but also contributed to the company's innovation trajectory. His work has positioned Lehighton Electronics as a key player in advanced measurement solutions.

Collaborations

Zuidervliet has collaborated with notable coworkers such as Nikolai Eberhardt and Jerome C. Licini. Together, they are driving advancements in the field, leveraging their combined expertise to tackle complex challenges in measurement technology.

Conclusion

William Zuidervliet exemplifies the spirit of innovation with his contributions to measurement technology. Through his patents, he has provided solutions that enhance the efficiency of semiconductor testing and mapping, ultimately benefiting the electronics industry. His collaborative efforts further underscore the importance of teamwork in achieving technological advancements.

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