Atlanta, GA, United States of America

William Stoy

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Georgia Tech Research Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William Stoy. Retrieved from https://idiyas.com/inventor/william-stoy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: William Stoy and the Reuse of Patch-Clamp Electrodes.

Introduction

William Stoy is an inventor associated with Georgia Tech Research Corporation in Atlanta, Georgia. His work includes a method designed to make patch-clamp glass pipette electrodes and planar patch-clamp chips reusable.

Latest Patents

Stoy is associated with 1 patent, titled “Systems and Methods Enabling Patch-Clamp Re-Use.” The invention describes cleaning pipette tips or planar patch-clamp chips by immersing them in detergent and then rinsing them. In reported experiments, the cleaned devices could be reused at least ten times with little to no degradation in signal fidelity. The preparations included human embryonic kidney cells, cultured neurons, tissue slices, and in vivo experiments.

Career Highlights

The patent addresses the practical challenge of reusing patch-clamp equipment while maintaining signal quality. Its described cleaning method offers an approach for extending the use of electrodes and chips across a range of experimental preparations.

Collaborations

Stoy’s listed coworkers include Ilya Kolb and Erin Rousseau. The invention is associated with Georgia Tech Research Corporation.

Conclusion

William Stoy’s patent presents a detergent-based cleaning method intended to support repeated use of patch-clamp electrodes and chips while preserving signal fidelity.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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