This inventor holds 1 USPTO granted patent. Top assignee: Rca Licensing Corporation. Active years: 1988.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1988
Title: The Innovative Contributions of William S. Ambler
Introduction
William S. Ambler is a notable inventor based in Manheim, PA (US). He is recognized for his innovative work in the field of measurement devices, particularly for his patent related to kinescope panels. His contributions have had a significant impact on the industry, showcasing his expertise and creativity.
Latest Patents
Ambler holds a patent for a "Device for measuring the periphery of an object." This device is designed to measure the periphery of kinescope panels of various sizes. It includes an elongated measuring member for each panel size, along with a gauge that is set to zero to obtain an optimum peripheral measurement. The elongated measuring member is tensioned around the panel, and the gauge reading indicates the difference between the actual panel periphery and the optimum panel periphery. This invention demonstrates Ambler's ability to create practical solutions for complex measurement challenges.
Career Highlights
William S. Ambler has made significant strides in his career, working with RCA Licensing Corporation. His role at the company has allowed him to develop and refine his inventions, contributing to advancements in measurement technology. His dedication to innovation is evident in his work and the impact it has had on the industry.
Collaborations
Ambler has collaborated with Leonard P. Wilbur, Jr., a fellow inventor. Their partnership has likely fostered a creative environment that encourages the development of new ideas and inventions.
Conclusion
William S. Ambler's contributions to the field of measurement devices highlight his innovative spirit and dedication to improving technology. His patent for measuring the periphery of kinescope panels is a testament to his ingenuity and commitment to excellence.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile