This inventor holds 1 USPTO granted patent. Top assignee: Rca Inc.. Active years: 1983.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1983
Title: The Innovative Contributions of William R. Frenchu
Introduction
William R. Frenchu is a notable inventor based in Princeton, NJ (US). He has made significant contributions to the field of infrared spectroscopy through his innovative designs and patents. His work has paved the way for advancements in material analysis, showcasing his expertise and dedication to scientific progress.
Latest Patents
William R. Frenchu holds a patent for a device designed for multisample infrared analysis of materials in microgram quantities. This sampling device is specifically adapted for mounting on conventional microsampling apparatuses used in infrared spectroscopy. The device allows for the sampling of multiple different unknown materials during a single operation. It supports an IR-transparent substrate, where solutions of samples are deposited. After the solvent evaporates, the residue of the unknown material can be analyzed using conventional spectroscopy procedures. The design enables rapid analysis by allowing each sample to be manually rotated into and out of exposure to the IR beam.
Career Highlights
Throughout his career, William R. Frenchu has been associated with RCA Inc., where he has contributed to various projects and innovations. His work in the field of spectroscopy has been instrumental in enhancing the capabilities of material analysis techniques.
Collaborations
William has collaborated with several professionals in his field, including his coworker Peter J. Zanzucchi. Their combined efforts have led to advancements in the technology used for infrared analysis.
Conclusion
William R. Frenchu's contributions to the field of infrared spectroscopy through his innovative patent demonstrate his commitment to advancing scientific knowledge. His work continues to influence the methods used in material analysis today.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
