Georgetown, MD, United States of America

William P Flynn

This inventor holds 1 USPTO granted patent. Top assignee: E.i. Dupont De Nemours and Company. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William P Flynn. Retrieved from https://idiyas.com/inventor/william-p-flynn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: The Innovations of William P. Flynn

Introduction

William P. Flynn is an accomplished inventor based in Georgetown, MD (US). He holds a patent for a unique method and apparatus for concomitant particulate deposition in electroless plating. This innovative approach enhances the plating process by subjecting objects to be plated to tumbling during the procedure.

Latest Patents

William P. Flynn has been granted 1 patent for his work. His patent focuses on a method that improves the efficiency and effectiveness of electroless plating, which is crucial in various manufacturing processes.

Career Highlights

William P. Flynn is associated with E.I. du Pont de Nemours and Company, a leading organization in the field of materials science and innovation. His contributions to the company have been significant, particularly in the area of plating technologies.

Collaborations

Throughout his career, William has collaborated with notable colleagues, including Theodore P. Christini and John B. Inskeep. These partnerships have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

William P. Flynn's contributions to the field of electroless plating demonstrate his commitment to innovation and excellence. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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