Company Filing History:
4 out of 737 
1 out of 31 
1 out of 832,961 Years Active: 1990-2001
Title: Innovations of William P Dube
Introduction
William P Dube is a notable inventor based in Denver, Colorado. He has made significant contributions to the field of x-ray technology, holding a total of six patents. His work focuses on advancing methods for diffraction measurement and monitoring casting processes.
Latest Patents
One of Dube's latest patents is titled "Method and apparatus for diffraction measurement using a scanning x-ray source." This invention relates to x-ray diffraction measurement by utilizing a moving x-ray source. The system comprises a raster-scanned x-ray source, a specimen, a collimator, and a detector. The electronically scanned x-ray source allows for the production of a complete image of the x-ray diffraction characteristics of the specimen. The specimen is positioned remotely from the x-ray source and the detector, with the collimator placed directly in front of the detector. The x-rays are diffracted by the specimen at specific angles, enabling them to travel through the collimator to the detector. This detector can measure the intensity and/or wavelength of the diffracted x-rays, providing all necessary information to solve the Bragg equation and the Laue equations. This invention is particularly useful for texture analysis and phase identification.
Another significant patent is the "Apparatus and method for monitoring casting process." This invention employs a high-energy x-ray, neutron, or gamma source to monitor the interface between molten and solidified crystalline phases during a casting process. The radiation is utilized to assess the quality and orientation of the crystals in the crystalline phase. By using distinctive diffraction patterns produced by crystalline and amorphous phases, the invention effectively locates the interface.
Career Highlights
Dube has worked with the Government of the United States of America, as represented by the Secretary of Commerce. His innovative work has contributed to advancements in x-ray technology and materials science.
Collaborations
Dube has collaborated with notable individuals such as Thomas A Siewert and Dale W Fitting. Their combined expertise has furthered the development of his inventions.
Conclusion
William P Dube's contributions to x-ray technology through his innovative patents demonstrate his significant impact in the field. His work continues to influence advancements in diffraction measurement and casting processes.