The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1996
Filed:
Mar. 21, 1995
Applicant:
Inventors:
Thomas A Siewert, Boulder, CO (US);
William P Dube, Denver, CO (US);
Dale W Fitting, Golden, CO (US);
Assignee:
National Institute of Standards and Technology, Washington, DC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
25039006 ; 25039009 ; 378 71 ;
Abstract
The present invention uses a high energy x-ray, neutron, or gamma source for monitoring the interface between a molten and solidified crystalline phase while in a furnace in a casting process. The radiation can also be used to determine the quality and orientation of the crystals in the crystalline phase. The invention uses the distinctive diffraction patterns produced by crystalline and amorphous phases to locate the interface.
Siewert, Thomas. (1996). Apparatus and method for monitoring casting process (U.S. Patent No. 5589690). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5589690
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile