Saskatoon, Canada

William Laverty

This inventor holds 1 USPTO granted patent. Top assignee: The Australian National University. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William Laverty. Retrieved from https://idiyas.com/inventor/william-laverty

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: William Laverty: Innovator in Individual Identification Methods

Introduction

William Laverty is a notable inventor based in Saskatoon, Canada. He has made significant contributions to the field of individual identification through his innovative methods. His work is particularly relevant in today's data-driven world, where accurate identification is crucial.

Latest Patents

William Laverty holds a patent for a "Method for forming a cohort for use in identification of an individual." This patent showcases his expertise in developing techniques that enhance the accuracy and efficiency of individual identification processes. He has 1 patent to his name, reflecting his commitment to innovation.

Career Highlights

Laverty is associated with The Australian National University, where he continues to advance his research and development efforts. His role at this esteemed institution allows him to collaborate with other leading experts in the field, further enhancing his contributions to innovation.

Collaborations

Some of his notable coworkers include Iain Donald Macleod and Fangxin Chen. Their collaborative efforts contribute to the advancement of research and development in individual identification methods.

Conclusion

William Laverty's work in the field of individual identification is both innovative and impactful. His patent and collaborations highlight his dedication to advancing technology in this important area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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