Lingfield, United Kingdom

William John Simpson

This inventor holds 1 USPTO granted patent. Top assignee: Biotrace Limited. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William John Simpson. Retrieved from https://idiyas.com/inventor/william-john-simpson-59hcqe41

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovations of William John Simpson

Introduction

William John Simpson is a notable inventor based in Lingfield, GB. He has made significant contributions to the field of monitoring techniques, particularly in the medical sector. His innovative approach has led to the development of a unique device that enhances the accuracy of swab methods.

Latest Patents

William John Simpson holds a patent for a "Device for use in monitoring a swab technique." This device comprises a first substrate positioned closely to a second substrate, with a test material placed between them. This invention aims to improve the reliability of swab testing, which is crucial in various medical applications.

Career Highlights

Simpson is associated with Biotrace Limited, a company that focuses on developing advanced monitoring solutions. His work at Biotrace Limited has allowed him to apply his innovative ideas in practical settings, contributing to the company's reputation in the industry.

Collaborations

One of his notable collaborators is Catherine Mary Ramsay. Their partnership has fostered a creative environment that encourages the development of new technologies and solutions.

Conclusion

William John Simpson's contributions to the field of monitoring techniques exemplify the impact of innovation in healthcare. His patent and work at Biotrace Limited highlight the importance of advancements in medical technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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