Council Bluffs, IA, United States of America

William J Stein

This inventor holds 1 USPTO granted patent. Top assignees: Transgenomic, Inc., Yokogawa Analytical Systems, Inc.. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William J Stein. Retrieved from https://idiyas.com/inventor/william-j-stein

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: William J. Stein and His Patent for Nebulized Sample Analysis.

Introduction

William J. Stein is an inventor associated with Council Bluffs, Iowa. His work includes a patented system and method for producing a nebulized sample analyte, designed to support the introduction of samples into analytical instruments such as mass spectrometers.

Latest Patents

Stein is credited with 1 patent: “System and Method for Producing Nebulized Sample Analyte Containing.” The invention provides a system that admits both liquid solution and gas to nebulize a sample. Its design aims to prevent damage to the sample delivery tube, electrical charging of the solution, re-nebulization, and analyte carry-over memory effects during sample introduction.

Career Highlights

Stein’s listed company affiliations include Transgenomic, Inc. and Yokogawa Analytical Systems, Inc. His patented work addresses practical challenges in delivering nebulized samples for analytical testing.

Collaborations

His listed coworkers include Akihiro Morioka and Junichi Takahashi, reflecting professional connections in the analytical systems and instrumentation field.

Conclusion

William J. Stein’s patent focuses on improving the reliability of nebulized sample delivery by addressing equipment damage and sample contamination concerns in analytical systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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