Sudbury, Canada

William J Middleton

This inventor holds 1 USPTO granted patent. Top assignees: Inco Limited, The University of Western Ontario. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William J Middleton. Retrieved from https://idiyas.com/inventor/william-j-middleton-qtpg1pwd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of William J Middleton

Introduction

William J Middleton is a notable inventor based in Sudbury, Canada. He has made significant contributions to the field of particulate measurement technology. His innovative approach has led to the development of a unique system that enhances the understanding of particulate concentration in gas flows.

Latest Patents

William J Middleton holds a patent for a system designed for the measurement of the concentration of particulates in a gas flow. This system includes an upstream device for electrically charging the particulate, a downstream device for sensing the intensity of the field produced by the electrically charged particulate, and an indicating device that is sensitive to the output of the downstream sensing device. He has 1 patent to his name.

Career Highlights

Throughout his career, Middleton has worked with prominent organizations such as Inco Limited and The University of Western Ontario. His experience in these institutions has allowed him to refine his skills and contribute to advancements in his field.

Collaborations

Some of his notable coworkers include G S Castle and Stig Lundquist. Their collaboration has likely enriched the research and development processes in which Middleton has been involved.

Conclusion

William J Middleton's innovative work in particulate measurement technology showcases his dedication to advancing scientific understanding. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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