Ballston Spa, NY, United States of America

William J Korman

This inventor holds 1 USPTO granted patent. Top assignee: US Government as Represented by the Secretary of the Army. Active years: 1995.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: The Innovations of William J. Korman

Introduction

William J. Korman is an accomplished inventor based in Ballston Spa, NY (US). He has made significant contributions to the field of stress measurement in solid components. His innovative approach has led to the development of a unique device that aids in understanding residual stresses.

Latest Patents

Korman holds a patent for a device known as a stress tester. This device is designed to measure residual stresses in solid components. It includes a hardness measuring component with an indenter that determines hardness at various locations. The stress data is obtained by converting the hardness measurements according to a specific formula. Korman's patent showcases his expertise and dedication to advancing technology in this area.

Career Highlights

William J. Korman works for the US Government as represented by the Secretary of the Army. His role involves applying his innovative ideas to enhance the capabilities of the organization. Korman's work is crucial in ensuring the reliability and performance of various components used in military applications.

Collaborations

Korman has collaborated with notable colleagues such as Agostino Abbate and Julius Frankel. These partnerships have allowed for the exchange of ideas and expertise, further enriching the development of innovative solutions in their field.

Conclusion

William J. Korman's contributions to the field of stress measurement through his patented device exemplify his commitment to innovation. His work not only benefits the US Government but also advances the understanding of material properties in engineering.

Profile summary based on public USPTO records.
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