Austin, TX, United States of America

William J Downey

This inventor holds 1 USPTO granted patent. Top assignee: Freescale Semiconductor,inc.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William J Downey. Retrieved from https://idiyas.com/inventor/william-j-downey-aei7imch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovations of William J Downey

Introduction

William J Downey is a notable inventor based in Austin, TX. He has made significant contributions to the field of integrated circuits. His work focuses on enhancing the reliability and integrity of electronic devices.

Latest Patents

William J Downey holds a patent for an "Integrated circuit interconnect crack monitor circuit." This innovative circuit device is mounted on a substrate and includes a detection circuit that monitors a characteristic of a return signal. The purpose of this invention is to determine the integrity of various interconnects of the device. He has 1 patent to his name.

Career Highlights

Downey is currently employed at Freescale Semiconductor, Inc., where he applies his expertise in integrated circuit technology. His work has contributed to advancements in the reliability of electronic components.

Collaborations

Throughout his career, William has collaborated with talented individuals such as Stanley A Cejka and Steven A Atherton. These collaborations have fostered innovation and development in their respective fields.

Conclusion

William J Downey's contributions to integrated circuit technology exemplify the spirit of innovation. His patent and work at Freescale Semiconductor, Inc. highlight his commitment to enhancing electronic device reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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