William J Barger

Title: William J. Barger and In-Circuit Testing Innovation.

Introduction

William J. Barger is an inventor associated with Thorndale, Pennsylvania, and Unisys Corporation. His patent work addresses the challenge of testing printed circuit assemblies that use high-frequency, low-voltage signals.

Latest Patents

Barger is credited with 1 patent: “Systems and Methods for Generating and Evaluating High Frequency, Low Voltage Swing Signals at In-Circuit Testing.” The invention describes methods for testing components of printed circuit assemblies that generate or use these signals. It divides and translates signals from an assembly into lower-frequency signals that an in-circuit test platform can evaluate, and it also enables the generation of compatible high-frequency signals for testing components. The system’s signal-processing logic can be bypassed, allowing the test platform and assembly to exchange signals even when system power is off.

Career Highlights

Barger’s listed patent reflects work on adapting in-circuit testing equipment to the signal requirements of printed circuit assemblies. His association with Unisys Corporation connects this invention to the company’s engineering and technology work.

Collaborations

Mark A. Capriotti and Mark W. Jennion are identified as Barger’s coworkers. The available information does not specify whether they collaborated with him on this patent.

Conclusion

William J. Barger’s patent focuses on making high-frequency, low-voltage signals practical to generate and evaluate during in-circuit testing, including when system power is off.