William H Hertzog

Title: The Innovations of William H Hertzog

Introduction

William H Hertzog is a notable inventor based in Goleta, CA (US). He has made significant contributions to the field of microscopy through his innovative patent. His work focuses on advancing the techniques used in scanning capacitance microscopy and spectroscopy.

Latest Patents

Hertzog holds a patent for an "Apparatus and method for scanning capacitance microscopy and spectroscopy." This invention describes an apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface. A high-frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atomic force microscope. Data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. The patent outlines methods for imaging tip-sample capacitance and conducting spectroscopic measurements at a single point on the sample. Additionally, it describes a method for system calibration.

Career Highlights

Hertzog's career is marked by his dedication to advancing scientific research and technology. His work at Asylum Research Corporation has positioned him as a key figure in the development of innovative microscopy techniques. His contributions have been instrumental in enhancing the capabilities of atomic force microscopy.

Collaborations

Hertzog has collaborated with notable colleagues, including Maarten Rutgers and Keith M Jones. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

William H Hertzog's contributions to the field of microscopy through his patent and work at Asylum Research Corporation highlight his role as an influential inventor. His innovative techniques continue to impact scientific research and technology.