This inventor holds 1 USPTO granted patent. Top assignee: Coulter Corporation. Active years: 1997.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1997
Title: William H. Hart: Innovator in Laser Diffraction Technology
Introduction
William H. Hart is a notable inventor based in Miami, FL (US). He has made significant contributions to the field of particle sizing through his innovative patent. His work primarily focuses on utilizing laser technology to enhance measurement accuracy in various applications.
Latest Patents
William H. Hart holds a patent for a "Laser diffraction particle sizing method using a monomode optical fiber." This invention involves a fiber optic spatial filter assembly for laser diffraction particle sizing apparatus. It utilizes a laser to generate a monochromatic light beam, which is coupled to an optical fiber operating in a monomode. This process creates a beam of light with a high degree of spatial coherence. The light is then passed through collimating lenses to interrogate and impinge upon particles of matter. The scattered light is focused onto a Fourier plane and subsequently measured by a photooptical detector array. This innovative method enables the computation of particle size based on the scattering angle of the light.
Career Highlights
William H. Hart is associated with Coulter Corporation, where he has contributed to advancements in optical technologies. His work has been instrumental in developing methods that improve the precision of particle size measurements, which are crucial in various scientific and industrial applications.
Collaborations
Throughout his career, William has collaborated with notable colleagues, including Brian D. Schmitz and Steven E. Bott. These collaborations have fostered an environment of innovation and have led to further advancements in the field.
Conclusion
William H. Hart's contributions to laser diffraction technology exemplify the impact of innovative thinking in scientific measurement. His patent reflects a significant advancement in particle sizing methods, showcasing the importance of precision in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile