Clemson, SC, United States of America

William Frederick Delaney


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Innovations of William Frederick Delaney

Introduction

William Frederick Delaney is an accomplished inventor based in Clemson, SC (US). He is known for his significant contributions to the field of optical sensors. His innovative work has led to the development of advanced technologies that enhance sensor performance.

Latest Patents

Delaney holds a patent for "Porous waveguide sensors featuring high confinement factors and method for making the same." This patent describes devices and methods for providing high-performance optical sensors. The sensor is comprised of a porous material designed to have a multilayer rib-type or multilayer pillar-type waveguide geometry. The resulting porous nanomaterial design is capable of achieving approximately 100% confinement factor while maintaining a small mode area and single-mode character. The fabrication of this device is enabled by an inverse processing technique, allowing for porous nanomaterial synthesis at either the wafer-scale or chip-scale after wafer dicing. While 100% is an optimal target, typical devices may operate with 98-99+% confinement, allowing for design adjustments while still maintaining high sensitivity.

Career Highlights

Delaney is affiliated with Clemson University, where he continues to advance his research and development in optical sensor technologies. His work has garnered attention for its innovative approach and practical applications in various fields.

Collaborations

Delaney has collaborated with notable colleagues, including Judson D. Ryckman and Gabriel Allen. Their combined expertise has contributed to the success of their projects and the advancement of sensor technology.

Conclusion

William Frederick Delaney's contributions to the field of optical sensors exemplify the spirit of innovation. His patented technologies are paving the way for future advancements in sensor performance and applications.

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