US

William Frederic Willis

This inventor holds 0 USPTO granted patents, plus 2 CIPO patents.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William Frederic Willis. Retrieved from https://idiyas.com/inventor/william-frederic-willis-m8izdmmz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

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Title: William Frederic Willis: Innovator in Biometric Technology

Introduction

William Frederic Willis is a notable inventor based in the United States. He has made significant contributions to the field of biometric technology, particularly through his innovative systems designed for identification and authentication.

Latest Patents

Willis's latest invention is the Multimodal Biometric Platform. This system includes a variety of biometric clients that capture biometric images of multiple types. The platform features a router that communicates with these clients, receiving biometric images and returning scores or results. Additionally, the system comprises several biometric matching engines, each equipped with multiple processors tailored to process specific types of biometric data. This innovative approach enhances the efficiency and accuracy of biometric identification.

Career Highlights

William Frederic Willis has been associated with Imageware Systems, Inc., where he has played a crucial role in advancing biometric technologies. His work has focused on creating systems that improve the reliability and versatility of biometric identification methods.

Collaborations

Some of his notable coworkers include James S. Miller and Johann Herbert Lau, who have collaborated with him on various projects within the biometric technology sector.

Conclusion

William Frederic Willis stands out as an influential figure in the realm of biometric innovations. His contributions continue to shape the future of identification and authentication systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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