Newtown, CT, United States of America

William F Theissen


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 32(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of William F. Theissen

Introduction

William F. Theissen is an accomplished inventor based in Newtown, Connecticut. He is known for his significant contributions to the field of probing devices, particularly in the semiconductor industry. His innovative approach has led to the development of a unique temperature compensated vertical pin probing device.

Latest Patents

William F. Theissen holds a patent for his invention titled "Temperature Compensated Vertical Pin Probing Device." This device features a housing constructed with spaced upper and lower spacers made of Invar®, which are designed to maintain precision in temperature variations. The device incorporates thin sheets of silicon nitride ceramic material, which are laser-drilled with matching patterns of holes to support probe pins while insulating them from the housing. The careful selection of materials ensures that the coefficients of thermal expansion closely match that of the silicon chip being probed, allowing for accurate measurements across a wide range of temperatures.

Career Highlights

Throughout his career, William F. Theissen has made notable advancements in the design and functionality of probing devices. His work has been instrumental in enhancing the accuracy and reliability of semiconductor testing. He is currently associated with Wentworth Laboratories Limited, where he continues to innovate and contribute to the field.

Collaborations

William has collaborated with esteemed colleagues, including Stephen Evans and Francis T. McQuade. Their combined expertise has fostered an environment of innovation and excellence in their projects.

Conclusion

William F. Theissen's contributions to the field of probing devices exemplify the spirit of innovation. His patented technology not only addresses critical challenges in semiconductor testing but also sets a benchmark for future advancements in the industry.

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