Irvine, CA, United States of America

William E Saltzstein

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignees: Makani Science Inc., University of California. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William E Saltzstein. Retrieved from https://idiyas.com/inventor/william-e-saltzstein-7a9gi7a1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: William E. Saltzstein and Respiratory Measurement Innovation

Introduction

William E. Saltzstein is an inventor associated with Irvine, California. His patent work addresses a practical challenge in external respiratory measurement: applying a consistent prestrain to sensors so they can be positioned reliably on the body.

Latest Patents

Saltzstein is credited with 1 patent: “Prestrain Adhesive for External Respiratory Measurement Sensors.” The invention describes sandwiching a sensor between adhesive layers and stretching it by a fixed amount to match the length of a support layer. The support layer holds the sensor in this prestrained state until the device is applied to a surface. Removing the support layer leaves the sensor in a standardized, intended state of prestrain.

Career Highlights

Saltzstein’s listed organizational affiliations include the University of California and Makani Science Inc. His patent reflects work on sensor preparation and application for external respiratory measurement devices.

Collaborations

His listed coworkers include Michael Chu and Michelle Khine, whose names are associated with his professional and innovation network.

Conclusion

William E. Saltzstein’s patent focuses on standardizing sensor prestrain, offering a method intended to support consistent application in external respiratory measurement devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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