This inventor holds 2 USPTO granted patents. Top assignee: Educational Testing Service. Active years: 1996-1998.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996-1998
Title: Innovations by William C Ward, Jr.
Introduction
William C Ward, Jr. is an accomplished inventor based in Hopewell, NJ (US). He has made significant contributions to the field of computer-based testing, holding 2 patents that enhance the efficiency and effectiveness of educational assessments.
Latest Patents
One of his latest patents is titled "System and methods for computer based testing." This invention provides a comprehensive system and method for creating and administering computerized tests. The system includes a test development component for producing the test, a delivery system for presenting the test to examinees, and a workstation for the actual test delivery. The method involves producing a computerized test, delivering it to examinees, and recording their responses. Additionally, it outlines the preparation of test documents, computerization of test items, and the packaging of all components to form a cohesive computerized test. The invention also includes a data distribution system that updates an examinee performance database with relevant information.
Career Highlights
William C Ward, Jr. is associated with Educational Testing Service, a prominent organization in the field of educational assessment. His work focuses on improving the testing experience for both educators and students through innovative technological solutions.
Collaborations
He has collaborated with notable colleagues such as Frank J Romano and Leonard C Swanson, contributing to advancements in the field of educational testing.
Conclusion
William C Ward, Jr. continues to be a pivotal figure in the realm of computer-based testing, driving innovations that enhance educational assessments. His contributions are invaluable in shaping the future of testing methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
