Dunlap, IL, United States of America

William C Hurt, Ii

This inventor holds 1 USPTO granted patent. Top assignee: Caterpillar Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William C Hurt, Ii. Retrieved from https://idiyas.com/inventor/william-c-hurt-ii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: William C. Hurt II: Inventor of a Parts Catalog System.

Introduction

William C. Hurt II is an inventor associated with Dunlap, Illinois, and Caterpillar Inc. His patent work includes a system designed to make hardware-item information easier to view and manage.

Latest Patents

Hurt is credited with 1 patent, titled “Parts Catalog System.” The invention describes a processor-based system with a database for cataloging collections of data associated with hardware items. Its graphical user interface can display a hardware item’s graphical representation alongside data fields that show the physical significance of particular information. The fields can also accept input to designate desired values.

Career Highlights

Hurt’s patent reflects an approach to parts cataloging that combines visual representations with structured data. By integrating item illustrations and editable data fields, the system is designed to help users interpret and manage information about hardware components.

Collaborations

Hurt’s listed coworkers include James G. Katter Jr. and Dennis L. Faux. His work is associated with Caterpillar Inc.

Conclusion

William C. Hurt II’s “Parts Catalog System” brings together a searchable hardware database, visual item representations, and interactive data fields to support parts cataloging.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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