Company Filing History:
Years Active: 2014
Title: William Benjamin Schaefer, IV: Innovator in Virtual Test Bench Generation
Introduction
William Benjamin Schaefer, IV is an accomplished inventor based in Palo Alto, CA. He is known for his innovative contributions to the field of testing systems, particularly in generating virtual test benches. His work has significant implications for improving the efficiency and effectiveness of testing requirements in various applications.
Latest Patents
William holds a patent for a "System and method for generating virtual test benches." This patent describes a method and system that automatically generates a test bench for testing a requirement. The test bench generator subsystem selects a test template based on user specifications and associates the requirement with relevant information such as parameters, context identifiers, and success criteria. The subsystem then generates a test bench data construct for simulation, which evaluates the success or failure of the requirement. Notably, the process includes automatically choosing a system model for the test bench.
Career Highlights
William is currently employed at Cydesign, Inc., where he applies his expertise in developing advanced testing solutions. His innovative approach has contributed to the company's reputation for excellence in the field. With a focus on automation and efficiency, William's work is paving the way for future advancements in testing methodologies.
Collaborations
William has collaborated with notable colleagues, including Serdar Uckun and Mark Flanagan Ward. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge solutions.
Conclusion
William Benjamin Schaefer, IV is a prominent figure in the realm of virtual test bench generation. His innovative patent and contributions to Cydesign, Inc. highlight his commitment to advancing testing technologies. His work continues to influence the industry and set new standards for efficiency and effectiveness in testing requirements.