The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Apr. 25, 2013
Cydesign Labs Inc., Palo Alto, CA (US);
Serdar Uckun, Palo Alto, CA (US);
William Benjamin Schaefer, IV, Palo Alto, CA (US);
Mark Flanagan Ward, Palo Alto, CA (US);
Kerry Ryan Poppa, Palo Alto, CA (US);
Michael Theodore Koopmans, Palo Alto, CA (US);
Mark Edwin Drummond, Palo Alto, CA (US);
Lee Travis Bergmann Johnson, Palo Alto, CA (US);
Cydesign, Inc., San Jose, CA (US);
Abstract
A method and system for generating a test bench for testing a requirement is described. According to an embodiment, a test bench generator subsystem automatically chooses a test template based on a user specification of a requirement to be tested. The requirement is automatically associated with information such as parameters, context identifiers, and success criteria. The subsystem automatically generates a test bench data construct for a simulation that will test the requirement and evaluate success or failure. In an embodiment, generating the test bench includes automatically choosing a system model for the test bench.