This inventor holds 1 USPTO granted patent. Top assignee: Biochem Sensors, Inc.. Active years: 1986.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1986
Title: William B Armiger: Innovator in Optical Measurement Technology
Introduction
William B Armiger is a notable inventor based in King of Prussia, PA (US). He has made significant contributions to the field of optical measurement technology, particularly through his innovative patent that enhances the monitoring of material characteristics.
Latest Patents
Armiger holds a patent for an optical apparatus and method for measuring the characteristics of materials by their fluorescence. This improved apparatus allows for the monitoring of materials by utilizing a unique design that provides common fields of view for both the illuminating light and the emitted fluorescence. In its preferred form, the optical paths are coaxial, enabling the device to be contained within a probe that can be inserted directly into a vessel containing the material to be analyzed. The design is specifically engineered to withstand sterilization with steam, operate aseptically within biological processes, and maintain high stability and sensitivity over extended periods of time. He has 1 patent to his name.
Career Highlights
Armiger's career is marked by his work at Biochem Sensors, Inc., where he has applied his expertise in optical technology to develop innovative solutions for material analysis. His contributions have been instrumental in advancing the capabilities of optical measurement devices.
Collaborations
Armiger has collaborated with notable colleagues, including William R MacBride and James A Magee, to further enhance the development of optical measurement technologies.
Conclusion
William B Armiger's innovative work in optical measurement technology has made a significant impact in the field. His patent for an advanced optical apparatus demonstrates his commitment to improving material analysis methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile