Eindhoven, Netherlands

Wilhelmus G Rippens

This inventor holds 1 USPTO granted patent. Top assignee: U.S. Philips Corporation. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wilhelmus G Rippens. Retrieved from https://idiyas.com/inventor/wilhelmus-g-rippens

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: Wilhelmus G. Rippens: Inventor in Optical Recording

Introduction

Wilhelmus G. Rippens is an inventor associated with Eindhoven, the Netherlands. His recorded patent work concerns optical recording technology, and he is associated with U.S. Philips Corporation.

Latest Patents

The available information lists one patent for Rippens: “Optical Recording Provided with a Chalcogenide Recording Layer.” The invention describes an optical recording element with a transparent synthetic-resin substrate, or a substrate coated with synthetic resin, and a chalcogenide recording layer. A thermally conductive chromium layer on at least one surface of the recording layer helps protect it from damage caused by continuous laser light used to read recorded information. The listed patent count is 1 patent.

Career Highlights

Rippens’s documented contribution focuses on protecting chalcogenide recording media during optical readout. The patent is associated with U.S. Philips Corporation.

Collaborations

Rippens’s listed coworker is Jan A. Markvoort. The available information identifies their association but does not specify the details of their collaboration.

Conclusion

Wilhelmus G. Rippens’s recorded patent work highlights a practical approach to improving the durability of optical recording elements through a thermally conductive chromium layer.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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