Erlangen, Germany

Wilhelm Stuermer

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 1978.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wilhelm Stuermer. Retrieved from https://idiyas.com/inventor/wilhelm-stuermer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1978

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1 patent (USPTO):Explore Patents

Title: Wilhelm Stuermer: Innovator in Dental Imaging

Introduction

Wilhelm Stuermer is a notable inventor based in Erlangen, Germany. He has made significant contributions to the field of dental imaging, particularly with his innovative approach to packaging intraoral dental X-ray films. His work has enhanced the efficiency and effectiveness of dental diagnostics.

Latest Patents

Stuermer holds a patent for a "Package for intraoral dental X-ray films." This invention features a plastic pouch that contains an X-ray film along with a selectively removable intensifier foil positioned on at least one side within the pouch. This design improves the usability and protection of dental X-ray films.

Career Highlights

Wilhelm Stuermer is associated with Siemens Aktiengesellschaft, a leading global technology company. His role at Siemens has allowed him to work on cutting-edge technologies that advance the field of dental imaging and diagnostics.

Collaborations

Throughout his career, Stuermer has collaborated with esteemed colleagues such as Johannes Seissl and Kurt Franke. These partnerships have fostered innovation and contributed to the development of new technologies in the dental field.

Conclusion

Wilhelm Stuermer's contributions to dental imaging through his patented innovations demonstrate his commitment to improving healthcare technology. His work continues to influence the industry and enhance patient care.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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