Latham, NY, United States of America

Wilfried Scholz

This inventor holds 1 USPTO granted patent. Top assignee: US Government as Represented by the Secretary of the Army. Active years: 1995.


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Wilfried Scholz: Innovator in Stress Measurement Technology

Introduction

Wilfried Scholz is a notable inventor based in Latham, NY (US). He has made significant contributions to the field of stress measurement technology. His innovative approach has led to the development of a unique device that measures residual stresses in solid components.

Latest Patents

Wilfried Scholz holds a patent for a device known as a stress tester. This device is designed to measure residual stresses in solid components effectively. It includes a hardness measuring component with an indenter that determines hardness at various locations. The stress data is obtained by converting the hardness measurements according to a specific formula.

Career Highlights

Wilfried Scholz is currently employed by the US Government as represented by the Secretary of the Army. His work focuses on advancing technologies that enhance the understanding of material properties and stress analysis.

Collaborations

Some of his notable coworkers include Agostino Abbate and Julius Frankel. Their collaborative efforts contribute to the innovative environment in which Scholz operates.

Conclusion

Wilfried Scholz's contributions to stress measurement technology exemplify the impact of innovation in engineering. His work continues to influence the field and improve the understanding of material stresses.

Profile summary based on public USPTO records.
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