Delmenhorst, Germany

Wilfried Pieles

This inventor holds 1 USPTO granted patent. Top assignee: Airbus Operations Gmbh. Active years: 2012.


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations by Wilfried Pieles in Flaw Detection Technology

Introduction

Wilfried Pieles is an accomplished inventor based in Delmenhorst, Germany. He has made significant contributions to the field of flaw detection in fibre-reinforced components. His innovative approach has led to the development of a unique device that enhances the detection of delamination in critical areas.

Latest Patents

Wilfried Pieles holds a patent for a "Device for detecting a flaw in a component." This invention focuses on detecting flaws, particularly delamination in the bearing region of holes, using at least one probe. The device emits and detects an ultrasound field, which is coupled to the component at an angle of incidence greater than 0° from the normal of the upper side. This oblique radiation technique allows for a higher resolution in identifying delamination issues. The device also features variants that utilize a linear probe housed in a self-positioning holder, enhancing its functionality.

Career Highlights

Wilfried Pieles is associated with Airbus Operations GmbH, where he applies his expertise in developing advanced detection technologies. His work is pivotal in ensuring the integrity and safety of components used in aerospace applications.

Collaborations

He collaborates with notable colleagues such as Stefan Elze and Rudolf Henrich, contributing to a team that focuses on innovative solutions in the aerospace sector.

Conclusion

Wilfried Pieles's contributions to flaw detection technology exemplify the importance of innovation in ensuring safety and reliability in engineering applications. His patented device represents a significant advancement in the field, showcasing his commitment to excellence in technology.

Profile summary based on public USPTO records.
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