Korntal-Münchingen, Germany

Wilfried Hammelehle

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Endress+hauser Conducta Gesellschaft Fur Mess- Und Regeltechnik Mbh+co. Kg. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wilfried Hammelehle. Retrieved from https://idiyas.com/inventor/wilfried-hammelehle

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Wilfried Hammelehle: Inventor in Sensor Monitoring

Introduction

Wilfried Hammelehle is an inventor associated with Korntal-Münchingen, Germany. His patent work addresses the monitoring of sensor function, particularly for sensors used to measure and monitor the condition of liquids and gases.

Latest Patents

Hammelehle is associated with 1 patent, titled “Method for Monitoring Sensor Function.” The invention describes recording and storing sensor test parameters at intervals, then evaluating their chronological development to monitor sensor performance. By using past test data to predict future sensor behavior, the method can provide information about how long the sensor is expected to operate without disturbance.

Career Highlights

Hammelehle’s listed company affiliations include Endress+Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH+Co. KG and Endress+Hauser Conducta GmbH+Co. KG. These affiliations connect his work with process measurement and control technology.

Collaborations

His listed coworkers include Detlev Wittmer and Axel Fikus.

Conclusion

Wilfried Hammelehle’s patent focuses on using the development of stored test parameters to assess sensor function and anticipate remaining disturbance-free operation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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