Enschede, Netherlands

Wietze Meijer

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Thales Nederland B.v.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wietze Meijer. Retrieved from https://idiyas.com/inventor/wietze-meijer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Wietze Meijer: Innovator in Radar Technology

Introduction

Wietze Meijer is a notable inventor based in Enschede, Netherlands. He has made significant contributions to the field of radar technology, particularly in the area of multi-target detection methods. His innovative work has implications for surveillance systems and radar applications.

Latest Patents

Wietze Meijer holds a patent for a "Multi-targets detection method applied in particular to surveillance radars with multi-beamforming in elevation." This patent describes a radar system that includes transmitter means for generating bursts of radar pulses. Each scan of the radar consists of a number (N) of bursts, and the method is designed to enhance detection capabilities for multiple targets.

Career Highlights

Wietze Meijer is associated with Thales Nederland B.V., a company known for its advanced technology solutions. His work at Thales has allowed him to focus on developing innovative radar systems that improve surveillance and detection efficiency.

Collaborations

Throughout his career, Wietze has collaborated with talented individuals such as Hans Driessen and Jitse Zwaga. These partnerships have contributed to the advancement of radar technology and the successful implementation of his patented methods.

Conclusion

Wietze Meijer is a prominent figure in radar technology, with a focus on multi-target detection methods. His contributions through patents and collaborations continue to influence the field significantly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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