Karlsruhe, Germany

Werner Helget

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1991.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,453 
Other
 patents

Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Werner Helget - Innovator in Optical Measurement Technology

Introduction

Werner Helget is a notable inventor based in Karlsruhe, Germany. He has made significant contributions to the field of optical measurement technology. His innovative approach has led to the development of a unique method for measuring rotation angles.

Latest Patents

Werner Helget holds a patent for a method and apparatus for measuring a rotation angle. The patent, titled "Rotation angle measuring with overlap area between two optical," describes a system that utilizes at least one rotatable optical grating. This grating is pivotal on a rotation axis relative to one or more slits that are parallel to it. The design allows for precise measurement of rotation angles by pivoting the rotatable optical grating relative to a stationary optical grating. The overlap area defined between the two optical gratings is crucial for detecting the relative movement, which is monitored by at least one photoelectric receiver. He has 1 patent to his name.

Career Highlights

Throughout his career, Werner Helget has demonstrated a commitment to advancing optical measurement techniques. His work has been instrumental in enhancing the accuracy and efficiency of rotation angle measurements.

Collaborations

Werner has collaborated with notable colleagues such as Bertold Deppisch and Gunther Krieg. Their combined expertise has contributed to the success of various projects in the field.

Conclusion

In summary, Werner Helget is a distinguished inventor whose work in optical measurement technology has paved the way for innovative solutions in the industry. His contributions continue to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
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