Werner F Roddeck

Title: Werner F. Roddeck: Innovator in Layer Thickness Measurement

Introduction

Werner F. Roddeck is a notable inventor based in Velbert, Germany, recognized for his contributions to the field of measurement technology. He holds two patents that showcase his innovative approaches to layer thickness measurement.

Latest Patents

Roddeck's latest patents include a method and apparatus for layer thickness measurement. This invention involves measuring the coating thickness of non-magnetic substances on ferromagnetic materials using the magneto-inductive method, as well as non-metallic substances on conductive materials through the eddy current method. The process utilizes a probe whose coil inductance is evaluated to determine the thickness of the layer. Adjustments are made to account for the geometry and magnetic properties of the specimen before measurements are taken. The data collected is processed by a microcomputer, which calculates the thickness values based on stored relationships between coil inductance and distance.

Another significant patent by Roddeck is a method for ultrasonic measurement of thickness. This technique employs pulse reflection ultrasonics to measure the thickness of test articles. The method involves generating a triggering signal in phase with a measuring oscillation of a known frequency. By counting the integral number of measuring oscillation pulses within a specific time period, the method achieves high accuracy while minimizing the disadvantages of analog circuits. This innovation is particularly useful for portable battery-operated devices.

Career Highlights

Throughout his career, Roddeck has worked with prominent companies such as Karl Deutsch Prüf- und Messgerätebau GmbH & Co. KG. His experience in these organizations has contributed to his expertise in measurement technologies.

Collaborations

Roddeck has collaborated with notable colleagues, including Heinz-Peter Schäfer and Volker K. Deutsch. Their combined efforts have further advanced the field of measurement technology.

Conclusion

Werner F. Roddeck's innovative patents and career achievements highlight his significant contributions to layer thickness measurement technology. His work continues to influence advancements in the field, showcasing the importance of precision in measurement techniques.