Uster, Switzerland

Werner Arb

This inventor holds 1 USPTO granted patent. Top assignee: Zellweger Luwa Ag. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Werner Arb. Retrieved from https://idiyas.com/inventor/werner-arb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Werner Arb: Innovator in Yarn Quality Monitoring

Introduction

Werner Arb is a notable inventor based in Uster, Switzerland. He has made significant contributions to the field of textile technology, particularly in the monitoring of yarn quality. His innovative approach has led to the development of a unique process and device that enhances the detection of extraneous materials in yarns.

Latest Patents

Werner Arb holds a patent for a "Process and device for monitoring the quality of yarns." This invention focuses on differentiating extraneous materials within a yarn section from the yarn itself and other foreign substances. The process involves classifying a signal derived from the yarn in a classification field. This classification allows for the identification of the types of extraneous materials present in the yarn.

Career Highlights

Werner Arb is associated with Zellweger Luwa AG, a company known for its advancements in textile machinery and technology. His work at the company has been instrumental in pushing the boundaries of yarn quality monitoring.

Collaborations

One of his notable coworkers is Christoph Färber, with whom he has likely collaborated on various projects within the company.

Conclusion

Werner Arb's contributions to yarn quality monitoring exemplify the importance of innovation in the textile industry. His patent reflects a commitment to improving product quality and efficiency in yarn production.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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