Wern-Yan Koe

Title: Wern-Yan Koe: Innovator in Combinational Test Pattern Generation

Introduction

Wern-Yan Koe is a notable inventor based in San Jose, CA (US). He has made significant contributions to the field of combinational test pattern generation. With a total of 3 patents to his name, Koe has demonstrated his expertise and innovation in this specialized area.

Latest Patents

One of Koe's latest patents is a method and apparatus for combinational test pattern generation. This invention couples a change input scan chain test pattern with an initialization scan chain test pattern to produce a resultant scan chain test pattern. The resultant pattern is then applied to at least one combinational logic path. In one embodiment, the coupling is achieved by interleaving the change input scan chain test pattern with the initialization scan chain test pattern. In another embodiment, a constructed test pattern set is created from both the change input and the initialization scan chain test patterns.

Career Highlights

Wern-Yan Koe is currently employed at NEC Electronics Corporation, where he continues to innovate and develop new technologies. His work has had a significant impact on the field of electronic testing and design.

Collaborations

Koe collaborates with various professionals in his field, including his coworker Ping F Chen. Their combined expertise contributes to the advancement of technology in combinational test pattern generation.

Conclusion

Wern-Yan Koe is a distinguished inventor whose work in combinational test pattern generation has led to valuable patents and advancements in electronic testing. His contributions continue to shape the industry and inspire future innovations.