This inventor holds 1 USPTO granted patent. Top assignee: Guangdong University of Technology. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Innovations by Wenrui Liang in Chemical Mechanical Polishing
Introduction
Wenrui Liang is a notable inventor based in Guangzhou, China. He has made significant contributions to the field of chemical mechanical polishing, particularly in the processing of silicon carbide (SiC) wafers. His innovative approach has the potential to enhance the efficiency and effectiveness of wafer polishing techniques.
Latest Patents
Wenrui Liang holds a patent for a method titled "Method for chemical mechanical polishing of a SiC wafer based on a magnetorheological elastic metal contact corrosion polishing pad." This method involves several steps, including attaching a magnetorheological elastic metal contact corrosion polishing pad to a polishing disk and adding a non-corrosive electrolyte solution. The process applies a polishing magnetic field to control the contact state of abrasive and metal powders on the SiC wafer, allowing for precise control over the chemical reaction intensity and mechanical removal of materials from the wafer surface. He has 1 patent to his name.
Career Highlights
Wenrui Liang is affiliated with the Guangdong University of Technology, where he continues to advance research in materials processing and polishing techniques. His work is recognized for its innovative approach and practical applications in the semiconductor industry.
Collaborations
Wenrui Liang collaborates with esteemed colleagues such as Jiabin Lu and Da Hu. Their combined expertise contributes to the advancement of research and development in their field.
Conclusion
Wenrui Liang's contributions to the field of chemical mechanical polishing demonstrate his innovative spirit and commitment to advancing technology. His patent reflects a significant step forward in the processing of SiC wafers, showcasing the potential for improved manufacturing techniques in the semiconductor industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile